diff options
Diffstat (limited to 'drivers/net/ixgbe/ixgbe_ethtool.c')
| -rw-r--r-- | drivers/net/ixgbe/ixgbe_ethtool.c | 115 |
1 files changed, 64 insertions, 51 deletions
diff --git a/drivers/net/ixgbe/ixgbe_ethtool.c b/drivers/net/ixgbe/ixgbe_ethtool.c index bcba057b510..f2efa324535 100644 --- a/drivers/net/ixgbe/ixgbe_ethtool.c +++ b/drivers/net/ixgbe/ixgbe_ethtool.c @@ -847,11 +847,8 @@ static int ixgbe_get_eeprom(struct net_device *netdev, if (!eeprom_buff) return -ENOMEM; - for (i = 0; i < eeprom_len; i++) { - if ((ret_val = hw->eeprom.ops.read(hw, first_word + i, - &eeprom_buff[i]))) - break; - } + ret_val = hw->eeprom.ops.read_buffer(hw, first_word, eeprom_len, + eeprom_buff); /* Device's eeprom is always little-endian, word addressable */ for (i = 0; i < eeprom_len; i++) @@ -1236,46 +1233,62 @@ static const struct ixgbe_reg_test reg_test_82598[] = { { 0, 0, 0, 0 } }; -static const u32 register_test_patterns[] = { - 0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF -}; - -#define REG_PATTERN_TEST(R, M, W) \ -{ \ - u32 pat, val, before; \ - for (pat = 0; pat < ARRAY_SIZE(register_test_patterns); pat++) { \ - before = readl(adapter->hw.hw_addr + R); \ - writel((register_test_patterns[pat] & W), \ - (adapter->hw.hw_addr + R)); \ - val = readl(adapter->hw.hw_addr + R); \ - if (val != (register_test_patterns[pat] & W & M)) { \ - e_err(drv, "pattern test reg %04X failed: got " \ - "0x%08X expected 0x%08X\n", \ - R, val, (register_test_patterns[pat] & W & M)); \ - *data = R; \ - writel(before, adapter->hw.hw_addr + R); \ - return 1; \ - } \ - writel(before, adapter->hw.hw_addr + R); \ - } \ +static bool reg_pattern_test(struct ixgbe_adapter *adapter, u64 *data, int reg, + u32 mask, u32 write) +{ + u32 pat, val, before; + static const u32 test_pattern[] = { + 0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; + + for (pat = 0; pat < ARRAY_SIZE(test_pattern); pat++) { + before = readl(adapter->hw.hw_addr + reg); + writel((test_pattern[pat] & write), + (adapter->hw.hw_addr + reg)); + val = readl(adapter->hw.hw_addr + reg); + if (val != (test_pattern[pat] & write & mask)) { + e_err(drv, "pattern test reg %04X failed: got " + "0x%08X expected 0x%08X\n", + reg, val, (test_pattern[pat] & write & mask)); + *data = reg; + writel(before, adapter->hw.hw_addr + reg); + return 1; + } + writel(before, adapter->hw.hw_addr + reg); + } + return 0; } -#define REG_SET_AND_CHECK(R, M, W) \ -{ \ - u32 val, before; \ - before = readl(adapter->hw.hw_addr + R); \ - writel((W & M), (adapter->hw.hw_addr + R)); \ - val = readl(adapter->hw.hw_addr + R); \ - if ((W & M) != (val & M)) { \ - e_err(drv, "set/check reg %04X test failed: got 0x%08X " \ - "expected 0x%08X\n", R, (val & M), (W & M)); \ - *data = R; \ - writel(before, (adapter->hw.hw_addr + R)); \ - return 1; \ - } \ - writel(before, (adapter->hw.hw_addr + R)); \ +static bool reg_set_and_check(struct ixgbe_adapter *adapter, u64 *data, int reg, + u32 mask, u32 write) +{ + u32 val, before; + before = readl(adapter->hw.hw_addr + reg); + writel((write & mask), (adapter->hw.hw_addr + reg)); + val = readl(adapter->hw.hw_addr + reg); + if ((write & mask) != (val & mask)) { + e_err(drv, "set/check reg %04X test failed: got 0x%08X " + "expected 0x%08X\n", reg, (val & mask), (write & mask)); + *data = reg; + writel(before, (adapter->hw.hw_addr + reg)); + return 1; + } + writel(before, (adapter->hw.hw_addr + reg)); + return 0; } +#define REG_PATTERN_TEST(reg, mask, write) \ + do { \ + if (reg_pattern_test(adapter, data, reg, mask, write)) \ + return 1; \ + } while (0) \ + + +#define REG_SET_AND_CHECK(reg, mask, write) \ + do { \ + if (reg_set_and_check(adapter, data, reg, mask, write)) \ + return 1; \ + } while (0) \ + static int ixgbe_reg_test(struct ixgbe_adapter *adapter, u64 *data) { const struct ixgbe_reg_test *test; @@ -1326,13 +1339,13 @@ static int ixgbe_reg_test(struct ixgbe_adapter *adapter, u64 *data) switch (test->test_type) { case PATTERN_TEST: REG_PATTERN_TEST(test->reg + (i * 0x40), - test->mask, - test->write); + test->mask, + test->write); break; case SET_READ_TEST: REG_SET_AND_CHECK(test->reg + (i * 0x40), - test->mask, - test->write); + test->mask, + test->write); break; case WRITE_NO_TEST: writel(test->write, @@ -1341,18 +1354,18 @@ static int ixgbe_reg_test(struct ixgbe_adapter *adapter, u64 *data) break; case TABLE32_TEST: REG_PATTERN_TEST(test->reg + (i * 4), - test->mask, - test->write); + test->mask, + test->write); break; case TABLE64_TEST_LO: REG_PATTERN_TEST(test->reg + (i * 8), - test->mask, - test->write); + test->mask, + test->write); break; case TABLE64_TEST_HI: REG_PATTERN_TEST((test->reg + 4) + (i * 8), - test->mask, - test->write); + test->mask, + test->write); break; } } |