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author | Shiju Jose <shiju.jose@huawei.com> | 2025-05-21 13:47:42 +0100 |
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committer | Dave Jiang <dave.jiang@intel.com> | 2025-05-23 13:24:20 -0700 |
commit | 85fb6a16ad14eab95e98bbba4f7d361f5cb83746 (patch) | |
tree | 3f2f939b92a644679659d27982bd8093cd473907 /scripts/rustdoc_test_builder.rs | |
parent | 0c6e6f1357cbdc158d555346a728aa4aeb0d7011 (diff) |
cxl/edac: Add CXL memory device ECS control feature
CXL spec 3.2 section 8.2.10.9.11.2 describes the DDR5 ECS (Error Check
Scrub) control feature.
The Error Check Scrub (ECS) is a feature defined in JEDEC DDR5 SDRAM
Specification (JESD79-5) and allows the DRAM to internally read, correct
single-bit errors, and write back corrected data bits to the DRAM array
while providing transparency to error counts.
The ECS control allows the requester to change the log entry type, the ECS
threshold count (provided the request falls within the limits specified in
DDR5 mode registers), switch between codeword mode and row count mode, and
reset the ECS counter.
Register with EDAC device driver, which retrieves the ECS attribute
descriptors from the EDAC ECS and exposes the ECS control attributes to
userspace via sysfs. For example, the ECS control for the memory media FRU0
in CXL mem0 device is located at /sys/bus/edac/devices/cxl_mem0/ecs_fru0/
Reviewed-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Reviewed-by: Fan Ni <fan.ni@samsung.com>
Reviewed-by: Dave Jiang <dave.jiang@intel.com>
Signed-off-by: Shiju Jose <shiju.jose@huawei.com>
Reviewed-by: Alison Schofield <alison.schofield@intel.com>
Acked-by: Dan Williams <dan.j.williams@intel.com>
Link: https://patch.msgid.link/20250521124749.817-5-shiju.jose@huawei.com
Signed-off-by: Dave Jiang <dave.jiang@intel.com>
Diffstat (limited to 'scripts/rustdoc_test_builder.rs')
0 files changed, 0 insertions, 0 deletions