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author | Baihan Li <libaihan@huawei.com> | 2025-08-13 17:42:28 +0800 |
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committer | Dmitry Baryshkov <dmitry.baryshkov@oss.qualcomm.com> | 2025-08-17 18:22:05 +0300 |
commit | e5f48bfa2ae0806d5f51fb8061afc619a73599a7 (patch) | |
tree | 22be83592bfc5e929cb84be62d21f30223897927 /scripts/rust_is_available_test.py | |
parent | 0f580d5d3d9d9cd0953695cd32e43aac3a946338 (diff) |
drm/hisilicon/hibmc: fix the i2c device resource leak when vdac init failed
Currently the driver missed to clean the i2c adapter when vdac init failed.
It may cause resource leak.
Fixes: a0d078d06e516 ("drm/hisilicon: Features to support reading resolutions from EDID")
Signed-off-by: Baihan Li <libaihan@huawei.com>
Signed-off-by: Yongbang Shi <shiyongbang@huawei.com>
Reviewed-by: Dmitry Baryshkov <dmitry.baryshkov@oss.qualcomm.com>
Link: https://lore.kernel.org/r/20250813094238.3722345-2-shiyongbang@huawei.com
Signed-off-by: Dmitry Baryshkov <dmitry.baryshkov@oss.qualcomm.com>
Diffstat (limited to 'scripts/rust_is_available_test.py')
0 files changed, 0 insertions, 0 deletions